Cohu Introduces cRacer mmWave Interface Platform for Semiconductor Test
January 07, 2021 at 09:00 am EST
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Cohu, Inc. announced the introduction of its cRacer RF interface platform for next generation mmWave device test. The cRacer contactor and probe head platform targets RF semiconductor test in the mobility contactor market, which is projected to grow from $200 million to approximately $275 million by 2023 with deployment of mmWave frequencies in smartphones and other mobile products. Cohu’s cRacer allows traditional spring probe contactors to reach greater than 54 GHz frequencies without compromising mechanical integrity or lifespan of the probes. When combined with Cohu’s PAx tester and RedDragon RF module, cRacer enables customers to achieve industry leading signal performance, accelerating time to production yield with a low cost-of-test architecture.
Cohu, Inc. is engaged in supplying test, interface, automation, inspection and metrology products, software and services to the semiconductor industry. The Company sells its products, such as semiconductor automated test equipment (ATE), semiconductor handlers, interface products, inspection and metrology, DI-Core data analytics, spares and kits and services. Its semiconductor ATE is used both for wafer level and device package testing. Its solutions consist primarily of two platforms for the system on a chip (SoC) device market: Diamondx tester and PAx tester. Interface Products are comprised of test contactors, probe heads and probe pins. Inspection and Metrology are products that provide advanced vision capabilities. DI-Core data analytics is a comprehensive software suite used to optimize Cohu equipment performance. Spares and Kits are consumable, non-consumable and spare items. It provides various parts and labor warranties on its test and handling systems and instruments.